| Report | |
| Created on: | 2019-06-21 12:14:51 |
| Operator: | Phil Wu |
| File | |
| File name: | C:\Users\Phil Wu\Documents\Data and Analysis\XRD\XPert\2019June19_Measurement_Hualien Rock Samples Powder Pressed\absolute scan_Si holder_1.xrdml |
| Checksum: | EF9F6C87AE213258DA8AC664904EFC74 |
| File size (bytes): | 10270 |
| Time stamp | |
| Started: | 2019-06-19 02:28:57 |
| Finished: | 2019-06-19 02:32:36 |
| Total time (h:m:s): | 00:03:39 |
| Comment | |
| Configuration=PW3071/xx Bracket, Owner=User-1, Creation date=2014/5/21 ?? 09:08:56 Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step size Omega:0.001 Sample stage=PW3071/xx Bracket Diffractometer system=XPERT-3 Measurement program=C:\PANalytical\Data Collector\Programs\absolute scan.xrdmp, Identifier={3CD96746-E7DD-4809-ACDF-08D444F0ED9D} |
|
| Status | |
| Completed | |
| Sample | |
| Sample type: | To be analyzed |
| Measurement type | |
| Single scan | |
| Used wavelength | |
| Intended wavelength type: | Kα1 |
| Kα1 (Å): | 1.540598 |
| Kα2 (Å): | 1.544426 |
| Kα2/Kα1 intensity ratio: | 0.50 |
| Kα (Å): | 1.541874 |
| Kβ (Å): | 1.392250 |
| Incident beam path | |
| Radius (mm): | 240.0 |
| X-ray tube | |
| Name: | Empyrean Cu LFF HR (9430 033 7310x) DK402428 |
| Anode material: | Cu |
| Voltage (kV): | 45 |
| Current (mA): | 40 |
| Focus | |
| Focus type: | Line |
| Length (mm): | 12.0 |
| width (mm): | 0.4 |
| Take-off angle (°): | 6.0 |
| Filter | |
| Name: | Beta-filter Nickel |
| Material: | Ni |
| Thickness (mm): | 0.020 |
| Soller slit | |
| Name: | Soller slits 0.04 rad. |
| Opening (rad.): | 0.04 |
| Mask | |
| Name: | Fixed incident beam mask 10 mm |
| Width (mm): | 6.60 |
| Anti-scatter slit | |
| Name: | Fixed slit 1/2° |
| Type: | Fixed |
| Height (mm): | 0.76 |
| Divergence slit | |
| Name: | Fixed slit 1/4° |
| Distance to sample (mm): | 140 |
| Type: | Fixed |
| Height (mm): | 0.38 |
| Angle (°): | 0.2177 |
| Diffracted beam path | |
| Radius (mm): | 240.0 |
| Anti-scatter slit | |
| Name: | Fixed slit 1/4° |
| Type: | Fixed |
| Height (mm): | 0.38 |
| Soller slit | |
| Name: | Soller slits 0.04 rad. |
| Opening (rad.): | 0.04 |
| Detector | |
| Name: | X’Celerator detector |
| Type: | RTMS detector |
| PHD – Lower level (%): | 37.5 |
| PHD – Upper level (%): | 79.5 |
| Mode: | Scanning |
| Active length (°): | 2.122 |
| Source | |
| Created by: | IOP |
| Application SW: | Data Collector vs. 4.4a |
| Instrument control SW: | XPERT-3 vs. 7.0/ 20131101 |
| Instrument ID: | 0000000011156094 |
| Sample mode | |
| Reflection | |
| Scan | |
| Start time stamp: | 2019-06-19 02:28:57 |
| End time stamp: | 2019-06-19 02:32:36 |
| Scan axis: | Gonio |
| Scan range (°): | 5.0000 – 89.9935 |
| Start position (°): | 5.0167 |
| End position (°): | 89.9768 |
| Step size (°): | 0.0334 |
| No. of points: | 2543 |
| Scan mode: | Continuous |
| Counting time (s): | 10.160 |
The measurement indicates material is amorphous = no identified x-ray peaks, in other words the silicon solid is not crystalline.
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