Si sample holder

100% Silicon sample holder
Silicon sample holder
Report
Created on: 2019-06-21 12:14:51
Operator: Phil Wu
File
File name: C:\Users\Phil Wu\Documents\Data and Analysis\XRD\XPert\2019June19_Measurement_Hualien Rock Samples Powder Pressed\absolute scan_Si holder_1.xrdml
Checksum: EF9F6C87AE213258DA8AC664904EFC74
File size (bytes): 10270
Time stamp
Started: 2019-06-19 02:28:57
Finished: 2019-06-19 02:32:36
Total time (h:m:s): 00:03:39
Comment
Configuration=PW3071/xx Bracket, Owner=User-1, Creation date=2014/5/21 ?? 09:08:56
Goniometer=PW3050/60 (Theta/Theta); Minimum step size 2Theta:0.001; Minimum step size Omega:0.001
Sample stage=PW3071/xx Bracket
Diffractometer system=XPERT-3
Measurement program=C:\PANalytical\Data Collector\Programs\absolute scan.xrdmp, Identifier={3CD96746-E7DD-4809-ACDF-08D444F0ED9D}
Status
Completed
Sample
Sample type: To be analyzed
Measurement type
Single scan
Used wavelength
Intended wavelength type: 1
1 (Å): 1.540598
2 (Å): 1.544426
2/Kα1 intensity ratio: 0.50
Kα (Å): 1.541874
Kβ (Å): 1.392250
Incident beam path
Radius (mm): 240.0
X-ray tube  
Name: Empyrean Cu LFF HR (9430 033 7310x) DK402428
Anode material: Cu
Voltage (kV): 45
Current (mA): 40
Focus  
Focus type: Line
Length (mm): 12.0
width (mm):  0.4
Take-off angle (°):  6.0
Filter  
Name: Beta-filter Nickel
Material: Ni
Thickness (mm): 0.020
Soller slit  
Name: Soller slits 0.04 rad.
Opening (rad.): 0.04
Mask  
Name: Fixed incident beam mask 10 mm
Width (mm): 6.60
Anti-scatter slit  
Name: Fixed slit 1/2°
Type: Fixed
Height (mm): 0.76
Divergence slit  
Name: Fixed slit 1/4°
Distance to sample (mm): 140
Type: Fixed
Height (mm): 0.38
Angle (°): 0.2177
Diffracted beam path
Radius (mm): 240.0
Anti-scatter slit  
Name: Fixed slit 1/4°
Type: Fixed
Height (mm): 0.38
Soller slit  
Name: Soller slits 0.04 rad.
Opening (rad.): 0.04
Detector  
Name: X’Celerator detector
Type: RTMS detector
PHD – Lower level (%): 37.5
PHD – Upper level (%): 79.5
Mode: Scanning
Active length (°): 2.122
Source
Created by: IOP
Application SW: Data Collector
vs. 4.4a
Instrument control SW: XPERT-3
vs. 7.0/ 20131101
Instrument ID: 0000000011156094
Sample mode
Reflection
Scan
Start time stamp: 2019-06-19 02:28:57
End time stamp: 2019-06-19 02:32:36
Scan axis: Gonio
Scan range (°):   5.0000 – 89.9935
Start position (°):   5.0167 
End position (°):  89.9768 
Step size (°):   0.0334
No. of points: 2543
Scan mode: Continuous
Counting time (s): 10.160
2\theta scan of the silicon sample holder

The measurement indicates material is amorphous = no identified x-ray peaks, in other words the silicon solid is not crystalline.

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  1. 自動引用通知: Rocks and Stones – Phillip M Wu

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